The Workshop on optical surface analysis methods for nanostructured layers will take place in the conference centre at the BAM facility in Berlin-Adlershof on 10th of October, 2019. The workshop is intended to bring together scientists and applications experts in the fields of nano-analysis of layers and surfaces with a multitude of different methods. The programme will cover investigation of structural parameters of layers by means of optical, X-ray spectroscopic, electron microscopic, and surface scanning methods.
Energy storage and conversion require nano-structured functional layers.
Therefore, nanomaterials use in energy applications will be a main focus in this event.
Venue
BAM Adlershof building 8.05 lecture hall and meeting rooms
Agenda
09:00 – 09:10: Opening: Andreas Hertwig
09:10 – 10:30 Session 1
09:10 – 09:30: 1. Talk: Dan Hodoroaba (BAM)
09:30 – 09:50: 2. Talk: Omar El Gawhary (VSL)
10:10 – 10:30: 3. Talk: Cornelia Streeck (PTB)
10:30 – 10:50: 4. Talk: Lidija Matjacic (NPL)
10:50 – 11:10: Coffee break
11:10 – 12:30 Session 2
11:10 – 11:30: 1. Talk: Emmanuel Nolot (CEA / LETI)
11:30 – 11:50: 2. Talk: René Sachse (BAM / TUB)
11:50 – 11:10: 3. Talk: Peter Thiesen (Accurion)
12:10 – 12:30: 4. Talk: Miroslav Valtr (CMI)
12:30 – 15:00: Lunch break, poster session, exhibition
Please find the abstracts here.
All participants welcome. There is no admission fee, but you have to register
via mail to:
thin-films@bam.de