recent selected publications from the HyMet project

References

	Thomas P. Weiss , Benjamin Bissig, Thomas Feurer, Romain Carron , Stephan Buecheler and Ayodhya N. Tiwari Bulk and surface recombination properties in thin film semiconductors with different surface treatments from time-resolved photoluminescence measurements DOI: 10.1038/s41598-019-41716-x
	Ravi Chandra Chintala, Sebastian Wood , James C. Blakesley, Paola Favia, Umberto Celano , Kristof Paredis, Wilfried Vandervorst and Fernando A. Castro Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography AIP Advances 9, 025105 (2019) DOI: 10.1063/1.5066458 https://doi.org/10.1063/1.5066458
	Roland Mainz , Helena Stange and Christian A. Kaufmann Defect Annihilation by Preferential Grain Growth during Cu(In,Ga)Se2Co-evaporation 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (2018) DOI: 10.1109/PVSC.2018.8547783 https://doi.org/10.1109/PVSC.2018.8547783
	O. El Gawhary, T. Van Mechelen and H. P. Urbach Role of Radial Charges on the Angular Momentum of Electromagnetic Fields: Spin-3/2 Light Phys. Rev. Lett. 121, 123202 (2018) DOI: 10.1103/PhysRevLett.121.123202
	Sebastian Wood , James C. Blakesley and Fernando A. Castro Assessing the Validity of Transient Photovoltage Measurements and Analysis for Organic Solar Cells Phys. Rev. Applied 10 (2), 024038 (2018) DOI: 10.1103/PhysRevApplied.10.024038 https://journals.aps.org/.../PhysRevApplied.10.024038
	Rainer Unterumsberger, Philipp Hönicke, Julien L. Colaux, Chris Jeynes, Malte Wansleben , Matthias Müller and Burkhard Beckhoff Accurate experimental determination of gallium K- and L3-shell XRF fundamental parameters Journal of Analytical Atomic Spectrometry 33, 1003-1013 (2018) DOI: 10.1039/C8JA00046H https://pubs.rsc.org/en/C...anding/2018/JA/C8JA00046H https://arxiv.org/abs/1805.02951
	René Sachse, Andreas Hertwig, Ralph Kraehnert and Vasile-Dan Hodoroaba Analysis of Mesoporous Iridium Oxide Thin Films by the Combined Methodical Approach SEM/EDS/STRATAGem Microscopy and Microanalysis 24 (S1), 762–763 (2018) DOI: 10.1017/S1431927618004300

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