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Our core competence in surface analysis is imaging ellipsometry where we are the world leading manufacturer of instrumentation. Imaging ellipsometry is a powerful combination of ellipsometry and optical microscopy used to characterize refractive indices, layer thicknesses and other optical parameters on samples with lateral structures as small as 1µm. Fields of application include MEMS, sensors, optical coatings, solar cells, data storage, flat panels, colloids and many more…
For more information please visit our website: www.accurion.com